Optotest OP1021 Launch Condition Analyzer

Item 80 of 165

This Launch Condition Analyzer analyses the Nearfiled as well as the Farfield of launch cables and sources over a wide wavelength range.

Nearfiled Analyzer
The Nearfiled (NF) describes the optical power density on the surface of a radiating source or the end of a fiber. The near field measurement can determine the refractive index profile of multimode fibers and the fiber’s mode filling.
With the included application OPL_LCA the Encircled Flux measurement is calculated and analyzed against the appropriate IEC template

Farfield Analyzer
The Farfield (FF) measurement is the optical power density of a source or fiber end on a surface measured at a radial distance. The farfield measurement can determine the numerical aperture of sources and fibers.

http://optotest.com/OP1021.html

,

Menu