CT400 – All-Band High Performance

Item 139 of 165

YENISTA proposes the ideal test solution for fast and accurate characterization of optical

components (Mux/Demux, filters…) and modules (OADM, WSS…).

Key parameters:

+/- 5pm wavelength accuracy

 1pm wavelength resolution

 Independent of Tunable Laser Source

 Up to 4 simultaneous detectors

 Continuous sweep over several lasers

http://yenista.com/Component-Tester,9.html

 

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