CT400 – All-Band High Performance

YENISTA proposes the ideal test solution for fast and accurate characterization of optical

components (Mux/Demux, filters…) and modules (OADM, WSS…).

Key parameters:

+/- 5pm wavelength accuracy

1pm wavelength resolution

Independent of Tunable Laser Source

Up to 4 simultaneous detectors

Continuous sweep over several lasers

http://yenista.com/Component-Tester,9.html